A Totally Self-Checking Error Indicator
IEEE Transactions on Computers
On error indication for totally self-checking systems
IEEE Transactions on Computers
Strongly Code Disjoint Checkers
IEEE Transactions on Computers
A methodology for testability enhancement at layout level
Journal of Electronic Testing: Theory and Applications
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Internal organization of the Alpha 21164, a 300-MHz 64-bit quad-issue CMOS RISC microprocessor
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Design of system-on-a-chip test access architectures under place-and-route and power constraints
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Introducing Core-Based System Design
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IEEE Design & Test
Evaluation of Clock Distribution Networks' Most Likely Faults and Produced Effects
DFT '01 Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
On-Line Testing Scheme for Clock's Faults
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Compact and Highly Testable Error Indicator for Self-Checking Circuits
DFT '96 Proceedings of the 1996 Workshop on Defect and Fault-Tolerance in VLSI Systems
An asynchronous totally self-checking two-rail code error indicator
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Highly testable and compact single output comparator
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IEEE Transactions on Computers
Low Cost and High Speed Embedded Two-Rail Code Checker
IEEE Transactions on Computers
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This paper proposes an on-chip detector for the on-line testing of faults affecting clock signals and making them change with incorrect duty-cycle. Our scheme is particularly suitable to be integrated within Systems-On-a-Chip (SOCs), in order to avoid their possible incorrect operation because of faults affecting clock signals, thus solving their extreme criticality in clock faults' testing. In particular, our detector is suitable to be applied to clock signals within each SOC digital core, to the clock signals at the interface between the diverse cores, as well as to those driving the DFT and BIST structures used to perform the SOC test. Our scheme features self-checking ability with respect to its possible internal faults belonging to a realistic set including stuck-ats, transistor stuck-ons, stuck-opens and resistive bridgings.