Introduction to VLSI Systems
Application of coding techniques in the design of self checking plas
Application of coding techniques in the design of self checking plas
On-Line Testing for VLSI—A Compendium of Approaches
Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing
Low-Cost Modular Totally Self-Checking Checker Design for $m$-out-of-$n$ Code
IEEE Transactions on Computers
Highly testable and compact 1-out-of-n code checker with single output
Proceedings of the conference on Design, automation and test in Europe
On-Chip Clock Faults' Detector
Journal of Electronic Testing: Theory and Applications
On-Line Testing Scheme for Clock's Faults
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Towards Totally Self-Checking Delay-Insensitive Systems
FTCS '95 Proceedings of the Twenty-Fifth International Symposium on Fault-Tolerant Computing
On the Design of Self-Checking Controllers with Datapath Interactions
IEEE Transactions on Computers
| Hi-index | 14.99 |
An efficient technique for designing a totally self-checking checker for 1/n code (n