A fast and low cost testing technique for core-based system-on-chip
DAC '98 Proceedings of the 35th annual Design Automation Conference
DAC '98 Proceedings of the 35th annual Design Automation Conference
Path delay fault testing of ICs with embedded intellectual property blocks
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Microprocessor based testing for core-based system on chip
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Structural Fault Testing of Embedded Cores Using Pipelining
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
Introducing Core-Based System Design
IEEE Design & Test
IEEE Design & Test
Test vector decompression via cyclical scan chains and its application to testing core-based designs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Accumulator based deterministic BIST
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A structured and scalable mechanism for test access to embedded reusable cores
ITC '98 Proceedings of the 1998 IEEE International Test Conference
1.2 Hierarchical Test Access Architecture for Embedded Cores in an Integrated Circuit
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
1.3 Parallelism in Structural Fault Testing of Embedded Cores
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Scan Vector Compression/Decompression Using Statistical Coding
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Bridging the Gap Between Embedded Test and ATE
ITC '00 Proceedings of the 2000 IEEE International Test Conference
An ILP Formulation to Optimize Test Access Mechanism in System-on-Chip Testing
ITC '00 Proceedings of the 2000 IEEE International Test Conference
A BUILT-IN TIMING PARAMETRIC MEASUREMENT UNIT
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
ITC '97 Proceedings of the 1997 IEEE International Test Conference
A SELF-TEST CIRCUIT FOR EVALUATING MEMORY SENSE-AMPLIFIER SIGNAL
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Test Requirements for Embedded Core-based Systems and IEEE P1500
ITC '97 Proceedings of the 1997 IEEE International Test Conference
A synthesis-for-transparency approach for hierarchical and system-on-a-chip test
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Achieving At-Speed Structural Test
IEEE Design & Test
Data-Independent Pattern Run-Length Compression for Testing Embedded Cores in SoCs
IEEE Transactions on Computers
Coupling EA and high-level metrics for the automatic generation of test blocks for peripheral cores
Proceedings of the 9th annual conference on Genetic and evolutionary computation
Test data compression based on geometric shapes
Computers and Electrical Engineering
Software-Based Testing for System Peripherals
Journal of Electronic Testing: Theory and Applications
| Hi-index | 0.09 |
Developments in fault-finding circuits built into ICs which will disclose defects in today's and tomorrow's block-based designs are examined