A SELF-TEST CIRCUIT FOR EVALUATING MEMORY SENSE-AMPLIFIER SIGNAL

Authors:
R. Dean Adams;Edmond S. Cooley;Patrick R. Hansen
Affiliations:
-;-;-
Venue:
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Year:
1997

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Abstract

An on-chip self-test circuit to evaluate an analogsense-amplifier signal for static random-access memorieswas designed and analyzed. This circuit augmentsmodern test equipment to achieve accuracy not previouslypossible.