Coupling EA and high-level metrics for the automatic generation of test blocks for peripheral cores

Authors:
Leticia Bolzani;Ernesto Sanchez;Massimiliano Schillaci;Giovanni Squillero
Affiliations:
Politecnico di Torino, Torino, Italy;Politecnico di Torino, Torino, Italy;Politecnico di Torino, Torino, Italy;Politecnico di Torino, Torino, Italy
Venue:
Proceedings of the 9th annual conference on Genetic and evolutionary computation
Year:
2007

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Abstract

Test of peripheral modules has not been deeply investigated by the research community. When embedded in a system on chip, however, peripherals pose accessibility problems that may make traditional test approaches ineffective. In this paper an evolutionary methodology, based upon coverage metrics at high-level, is described to automatically generate test sets for peripheral modules in a SoC. A general-purpose evolutionary tool, able to cultivate composite individuals, has been developed and isused for the test set generation. This tool is described and its basic concepts explained. The method compares favorably with results obtained by hand.