Bridging the Gap Between Embedded Test and ATE

Authors:
Martin Bell;Givargis Danialy;Michael Howells;Stephen Pateras
Affiliations:
-;-;-;-
Venue:
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Year:
2000

Citing 4
Cited 1

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Abstract

This paper presents a methodology and software system architecture that enable conventional test equipment to take full advantage of embedded test structures implemented within the device under test. The proposed methodology provides a seamless transfer of embedded test related information from thedesign engineering to the manufacturing test environment,allowing for automated control of the embedded test for productiongo/no-go testing as well as advanced failure diagnosis.