Built-in test for VLSI: pseudorandom techniques
Built-in test for VLSI: pseudorandom techniques
Introducing Core-Based System Design
IEEE Design & Test
Logic BIST for Large Industrial Designs: Real Issues and Case Studies
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Modeling and minimization of interconnect energy dissipation in nanometer technologies
Proceedings of the 38th annual Design Automation Conference
Overview of Popular Benchmark Sets
IEEE Design & Test
WCET analysis for a Java processor
JTRES '06 Proceedings of the 4th international workshop on Java technologies for real-time and embedded systems
JTRES '07 Proceedings of the 5th international workshop on Java technologies for real-time and embedded systems
A Java processor architecture for embedded real-time systems
Journal of Systems Architecture: the EUROMICRO Journal
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Through our experience in synthesis, validation, test, and integration of the picoJava processor core in a system-on-chip (SoC) design we point out the challenges faced and issues to address in efficient reuse of a soft core