Electromigration: the time bomb in deep-submicron ICs
IEEE Spectrum
On-line testing for VLSI: state of the art and trends
Integration, the VLSI Journal - Special issue on VLSI testing
Self-checking and fault-tolerant digital design
Self-checking and fault-tolerant digital design
Self-Checking Detection and Diagnosis of Transient, Delay, and Crosstalk Faults Affecting Bus Lines
IEEE Transactions on Computers
Reed-Solomon Codes and Their Applications
Reed-Solomon Codes and Their Applications
Computer
Introducing Core-Based System Design
IEEE Design & Test
A Study of the Error Behavior of a 32-bit RISC Subjected to Simulated Transient Fault Injection
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Testing embedded-core based system chips
ITC '98 Proceedings of the 1998 IEEE International Test Conference
On-line Error Detection Techniques for Dependable Embedded Processors with High Complexity
IOLTW '01 Proceedings of the Seventh International On-Line Testing Workshop
Custom circuit design as a driver of microprocessor performance
IBM Journal of Research and Development
On-line error detection and fast recover techniques for dependable embedded processors
On-line error detection and fast recover techniques for dependable embedded processors
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The use of very deep submicron technology makes VLSI-based digital systems more susceptible to transient or soft errors, and thus compromises their reliability. This paper proposes an architecture inspired by the human immune system that allows tolerance ...