A Study of the Error Behavior of a 32-bit RISC Subjected to Simulated Transient Fault Injection

  • Authors:
  • Marcus Rimén;Joakim Ohlsson

  • Affiliations:
  • -;-

  • Venue:
  • Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
  • Year:
  • 1992

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Abstract