Self-checking sequential circuits with self-healing ability
Proceedings of the 12th ACM Great Lakes symposium on VLSI
ACM Transactions on Embedded Computing Systems (TECS)
Logic Complement, a New Method of Checking the Combinational Circuits
Automation and Remote Control
Journal of Electronic Testing: Theory and Applications
Online and Offline BIST in IP-Core Design
IEEE Design & Test
Error-correction and crosstalk avoidance in DSM busses
Proceedings of the 2003 international workshop on System-level interconnect prediction
FMCAD '02 Proceedings of the 4th International Conference on Formal Methods in Computer-Aided Design
On-Line Techniques for Error Detection and Correction in Processor Registers with Cross-Parity Check
Journal of Electronic Testing: Theory and Applications
Error-correction and crosstalk avoidance in DSM busses
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A Technique for Designing Totally Self-Checking Domino Logic Circuits
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Improving quantum circuit dependability with reconfigurable quantum gate arrays
Proceedings of the 2nd conference on Computing frontiers
A Totally Self-Checking S-box Architecture for the Advanced Encryption Standard
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Self-Stabilizing Microprocessor: Analyzing and Overcoming Soft Errors
IEEE Transactions on Computers
Analysis of the impact of bus implemented EDCs on on-chip SSN
Proceedings of the conference on Design, automation and test in Europe: Proceedings
On-Chip Communication Architectures: System on Chip Interconnect
On-Chip Communication Architectures: System on Chip Interconnect
Robust codes and robust, fault-tolerant architectures of the Advanced Encryption Standard
Journal of Systems Architecture: the EUROMICRO Journal
Proceedings of the 17th ACM Great Lakes symposium on VLSI
Journal of Electronic Testing: Theory and Applications
Towards Nanoelectronics Processor Architectures
Journal of Electronic Testing: Theory and Applications
Interactive presentation: Improving the fault tolerance of nanometric PLA designs
Proceedings of the conference on Design, automation and test in Europe
Bilateral Testing of Nano-scale Fault-Tolerant Circuits
Journal of Electronic Testing: Theory and Applications
Towards fault tolerant parallel prefix adders in nanoelectronic systems
Proceedings of the conference on Design, automation and test in Europe
Self checking systolic FIFO stack
IMACS'08 Proceedings of the 7th WSEAS International Conference on Instrumentation, Measurement, Circuits and Systems
Estimating the latent time of fault detection in finite automaton tested in real time
Automation and Remote Control
Datapath error detection with no detection latency for high-performance microprocessors
WSEAS Transactions on Computers
Speed up Marouf and Friedman TSC berger codes checker
CSECS'08 Proceedings of the 7th conference on Circuits, systems, electronics, control and signal processing
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Constructing self-testing circuits with the use of step-by-step (cascade) control
Automation and Remote Control
On implementation of online testable state machines
ICC'09 Proceedings of the 13th WSEAS international conference on Circuits
New Self-Checking Booth Multipliers
International Journal of Applied Mathematics and Computer Science - Selected Problems of Computer Science and Control
Evolving and analysing "useful" redundant logic
ICES'07 Proceedings of the 7th international conference on Evolvable systems: from biology to hardware
On-line error detection and fast recover techniques for dependable embedded processors
On-line error detection and fast recover techniques for dependable embedded processors
One-to-Many: Context-Oriented Code for Concurrent Error Detection
Journal of Electronic Testing: Theory and Applications
System-level hardware-based protection of memories against soft-errors
Proceedings of the Conference on Design, Automation and Test in Europe
Efficient Concurrent Self-Test with Partially Specified Patterns
Journal of Electronic Testing: Theory and Applications
History index of correct computation for fault-tolerant nano-computing
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Increasing fault-tolerance in cellular automata-based systems
UC'11 Proceedings of the 10th international conference on Unconventional computation
Note on reliability of a system complexity
Mathematical and Computer Modelling: An International Journal
Cellular automata-based systems with fault-tolerance
Natural Computing: an international journal
Inexact design: beyond fault-tolerance
Communications of the ACM
Circuit Level Concurrent Error Detection in FSMs
Journal of Electronic Testing: Theory and Applications
Preserving Hamming Distance in Arithmetic and Logical Operations
Journal of Electronic Testing: Theory and Applications
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