Optimized Synthesis of Concurrently Checked Controllers
IEEE Transactions on Computers
Self-checking and fault-tolerant digital design
Self-checking and fault-tolerant digital design
The Designer's Guide to VHDL
Non-Intrusive Design of Concurrently Self-Testable FSMs
ATS '02 Proceedings of the 11th Asian Test Symposium
Error Detection in Fault Secure Controllers using State Encoding
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Finite State Machine Synthesis with Concurrent Error Detection
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Soft Errors in Advanced Computer Systems
IEEE Design & Test
Cascade Scheme for Concurrent Errors Detection
DSD '06 Proceedings of the 9th EUROMICRO Conference on Digital System Design
Monitoring Transient Errors in Sequential Circuits
ATS '07 Proceedings of the 16th Asian Test Symposium
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Finite state machines (FSMs) are contained in many building blocks of digital electronic circuits. Such electronic circuits are prone to transient errors, caused e.g. by cosmic radiation, and to permanent errors. In this article, the authors give an overview of known error detection methods for FSMs. One method (dependent state encoding for dynamic error detection) is described in detail, as well as the problems arising when the method is applied to a practical example. Additionally, the authors propose a modification of the method above. For several benchmark circuits, this modification shows better results, compared to the state-of-the-art implementation.