Soft Errors in Advanced Computer Systems

Authors:
Robert Baumann
Affiliations:
Texas Instruments
Venue:
IEEE Design & Test
Year:
2005

Citing 1
Cited 84

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Abstract

This article comprehensively analyzes soft-error sensitivity in modern systems and shows it to be application dependent. The discussion covers ground-level radiation mechanisms that have the most serious impact on circuit operation, along with the effect of technology scaling on soft-error rates in memory and logic.