Low-power soft error hardened latch

Authors:
Hossein Karimiyan Alidash;Vojin G. Oklobdzija
Affiliations:
ECE Department, Isfahan University of Technology, Isfahan, Iran;University of Texas at Dallas, Richardson, TX
Venue:
PATMOS'09 Proceedings of the 19th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and Simulation
Year:
2009

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Abstract

This paper presents a low-power soft error-hardened latch suitable for reliable circuit operation. The proposed circuit uses redundant feedback loop to protect latch against soft error on the internal nodes, and transmission gate and Schmitt-trigger circuit to filter out transient resulting from particle hit on combinational logic. The proposed circuit has low power consumption with negative setup time and low timing overhead. The HSPICE post-layout simulation in 90nm CMOS technology reveals that circuit is able to recover from almost any single particle strike on internal nodes and tolerates input SETs up to 130ps of duration.