Error Control Coding, Second Edition
Error Control Coding, Second Edition
Soft Errors in Advanced Computer Systems
IEEE Design & Test
Architecture Design for Soft Errors
Architecture Design for Soft Errors
A class of optimal minimum odd-weight-column SEC-DED codes
IBM Journal of Research and Development
Minimizing soft errors in TCAM devices: a probabilistic approach to determining scrubbing intervals
IEEE Transactions on Circuits and Systems Part I: Regular Papers
| Hi-index | 0.00 |
Soft Errors are becoming a major concern for modern computing systems. Memories are one of the elements affected by soft errors, which cause bitflips in some of the cells. A number of techniques such as the use of Error Correction Codes (ECCs), interleaving or scrubbing are utilized to mitigate the effects of soft errors on memories. Content Addressable Memories (CAMs) pose additional challenges, as many of those protection techniques are not applicable to CAMs. In this paper, a novel protection technique for CAMs is proposed, showing a convenient way to tackle false positives and negatives, and quantitatively studying the achieved benefit in reliability.