Utilization of SECDED for soft error and variation-induced defect tolerance in caches

Authors:
Luong D. Hung;Hidetsugu Irie;Masahiro Goshima;Shuichi Sakai
Affiliations:
The University of Tokyo, Hongo, Bunkyo, Tokyo, Japan;The University of Tokyo, Hongo, Bunkyo, Tokyo, Japan;The University of Tokyo, Hongo, Bunkyo, Tokyo, Japan;The University of Tokyo, Hongo, Bunkyo, Tokyo, Japan
Venue:
Proceedings of the conference on Design, automation and test in Europe
Year:
2007

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Abstract

Combination of SECDED with a redundancy technique can effectively tolerate a high variation-induced defect rate in future processes. However, while a defective cell in a block can be repaired by SECDED, the block becomes vulnerable to soft errors. This paper proposes a technique to deal with the degraded resilience against soft errors. Only clean data can be stored in defective blocks of a cache. This constraint is enforced through selective write-through mechanism. An error occurring in a defective block can be detected and the correct data can be obtained from the lower level caches.