The SimpleScalar tool set, version 2.0
ACM SIGARCH Computer Architecture News
LAPACK Users' guide (third ed.)
LAPACK Users' guide (third ed.)
Reliability Considerations for Advanced Microelectronics
PRDC '00 Proceedings of the 2000 Pacific Rim International Symposium on Dependable Computing
Cache Scrubbing in Microprocessors: Myth or Necessity?
PRDC '04 Proceedings of the 10th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC'04)
Soft error and energy consumption interactions: a data cache perspective
Proceedings of the 2004 international symposium on Low power electronics and design
An Error Detection and Correction Scheme for RAMs with Partial-Write Function
MTDT '05 Proceedings of the 2005 IEEE International Workshop on Memory Technology, Design, and Testing
Compilation techniques for energy reduction in horizontally partitioned cache architectures
Proceedings of the 2005 international conference on Compilers, architectures and synthesis for embedded systems
Compiler-directed selective data protection against soft errors
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Reducing Data Cache Susceptibility to Soft Errors
IEEE Transactions on Dependable and Secure Computing
Utilization of SECDED for soft error and variation-induced defect tolerance in caches
Proceedings of the conference on Design, automation and test in Europe
Computing and Minimizing Cache Vulnerability to Transient Errors
IEEE Design & Test
Partially protected caches to reduce failures due to soft errors in multimedia applications
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Cache vulnerability equations for protecting data in embedded processor caches from soft errors
Proceedings of the ACM SIGPLAN/SIGBED 2010 conference on Languages, compilers, and tools for embedded systems
Partitioning techniques for partially protected caches in resource-constrained embedded systems
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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Incessant and rapid technology scaling has brought us to a point where todays, and future transistors are susceptible to transient errors induced by energy carrying particles, called soft errors. Within a processor, the sheer size and nature of data in the caches render it most vulnerable to electrical interferences on static data in the cache. Data in the cache is vulnerable to corruption by soft errors, for the time it remains in the cache. Write-through and early-write-back [17] cache configurations reduce the time for vulnerable data in the cache, at the cost of increased memory writes and therefore energy. We propose a smart cache cleaning methodology, that enables copying of only specific vulnerable cache blocks into the memory at chosen times, thereby ensuring data cache protection with minimal memory writes. Our experiments over LINPACK and Livermore benchmarks demonstrate 26% reduced energy-vulnerability product compared to that of hardware cache configurations.