Self-checking and fault-tolerant digital design
Self-checking and fault-tolerant digital design
DFT '02 Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
CMOS Digital Integrated Circuits Analysis & Design
CMOS Digital Integrated Circuits Analysis & Design
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A scheme for concurrent self-checking domino logic circuit is proposed. The self-checking feature is achieved by transistor sharing of the original and its inverse functions and by using the outputs as 1-out-of-2 code. The sharing of transistors lowers the overhead required for the inverse function. A checker circuit is embedded into the self-checking implementation. The scheme is especially suitable for large CMOS domino logic circuits.