A CAD framework for generating self-checking multipliers based on residue codes
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Guest Editors' Introduction: Online VLSI Testing
IEEE Design & Test
Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes
IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)
On-Line Techniques for Error Detection and Correction in Processor Registers with Cross-Parity Check
Journal of Electronic Testing: Theory and Applications
An error recoverable structure based on complementary logic and alternating-retry
Journal of Computer Science and Technology
On-line error detection and fast recover techniques for dependable embedded processors
On-line error detection and fast recover techniques for dependable embedded processors
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