Standard Test Interface Language (STIL): A New Language for Patterns and Waveforms

System chip test: how will it impact your design?

Proceedings of the 37th Annual Design Automation Conference

On IEEE P1500's Standard for Embedded Core Test

Journal of Electronic Testing: Theory and Applications

Standard test interface language (STIL), extending the standard

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Testing embedded-core based system chips

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Defining ATPG rules checking in STIL

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Doing it in STIL: Intelligent Conversion From STIL to an ATE Format

ITC '00 Proceedings of the 2000 IEEE International Test Conference

On Using IEEE P1500 SECT for Test Plug-n-Play

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Tester Retargetable Patterns

ITC '01 Proceedings of the 2001 IEEE International Test Conference

A UNIFIED INTERFACE FOR SCAN TEST GENERATION BASED ON STIL

ITC '97 Proceedings of the 1997 IEEE International Test Conference

STRUCTURING STIL FOR INCREMENTAL TEST DEVELOPMENT

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Memory Test -- Debugging Test Vectors Without ATE

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Towards a Standard for Embedded Core Test: An Example

ITC '99 Proceedings of the 1999 IEEE International Test Conference