Standard test interface language (STIL), extending the standard

Authors:
Tony Taylor
Affiliations:
-
Venue:
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Year:
1998

Citing 3
Cited 2

Standard Test Interface Language (STIL): A New Language for Patterns and Waveforms

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Structuring STIL for Incremental Test Development

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A Unified Interface for Scan Test Generation Based on STIL

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On Using IEEE P1500 SECT for Test Plug-n-Play

ITC '00 Proceedings of the 2000 IEEE International Test Conference
Towards a Standard for Embedded Core Test: An Example

ITC '99 Proceedings of the 1999 IEEE International Test Conference

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Abstract

This paper is a status report on the currentstate of STIL (Standard Tester Interface Language)as developed by the IEEE-P1450 standards developmentcommittee, followed by a comprehensiveoverview of the areas that the committee is pursuingfor the next round of development for the language.This paper explains the rationale for theextensions being worked on, the applications forthese extensions, the process, and the time framethat is expected for this development.