System chip test: how will it impact your design?
Proceedings of the 37th Annual Design Automation Conference
Test of future system-on-chips
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
On IEEE P1500's Standard for Embedded Core Test
Journal of Electronic Testing: Theory and Applications
The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs
Journal of Electronic Testing: Theory and Applications
Divide-and-Conquer IDDQ Testing for Core-based System Chips
ASP-DAC '02 Proceedings of the 2002 Asia and South Pacific Design Automation Conference
On Using IEEE P1500 SECT for Test Plug-n-Play
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Wrapper Design for Embedded Core Test
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Test and Debug Strategy of the PNX8525 Nexperia" Digital Video Platform System Chip
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A Test Time Reduction Algorithm for Test Architecture Design for Core-Based System Chips
Journal of Electronic Testing: Theory and Applications
Towards a Standard for Embedded Core Test: An Example
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Test Features of a Core-Based Co-Processor Array for Video Applications
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Remote testing and diagnosis of System-on-Chips using network management frameworks
Proceedings of the conference on Design, automation and test in Europe
Hybrid BIST optimization using reseeding and test set compaction
Microprocessors & Microsystems
Analysis of the test data volume reduction benefit of modular SOC testing
Proceedings of the conference on Design, automation and test in Europe
| Hi-index | 0.25 |
Advances in semiconductor design and manufacturing technology enable the design of complete systems on one IC. To develop these system ICs in a timely manner, traditional IC design in which everything is designed from scratch, is replaced by a design style based on embedding large reusable modules, the so-called cores. Effectively, the design of a core-based IC is partitioned over the core provider(s) and the system-chip integrator. The development of tests should follow the same partitioning. We describe the differences between traditional and core-based test development, and present an overview of current industrial approaches. We list the future challenges regarding standardization, tool development, and academic and industrial research