On IEEE P1500's Standard for Embedded Core Test
Journal of Electronic Testing: Theory and Applications
A Set of Benchmarks fo Modular Testing of SOCs
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Layered Protocol Wrappers for Internet Packet Processing in Reconfigurable Hardware
HOTI '01 Proceedings of the The Ninth Symposium on High Performance Interconnects
Implementation of a Content-Scanning Module for an Internet Firewall
FCCM '03 Proceedings of the 11th Annual IEEE Symposium on Field-Programmable Custom Computing Machines
Enhancing Testability of System on Chips Using Network Management Protocols
Proceedings of the conference on Design, automation and test in Europe - Volume 2
Challenges in testing core-based system ICs
IEEE Communications Magazine
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This paper presents a new approach that allows remote testing and diagnosis of complex (Systems-on-Chip) and embedded IP cores. The approach extends both on-chip design-for-test (DFT) architectures and network management protocols to take full benefits from existing networking infrastructures. By running intensive experimentation on ITC'99 and ITC'02 design benchmarks, the efficiency of the proposed testing and diagnosis methodology is analyzed.