Analysis and minimization of test time in a combined BIST and external test approach
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Shift Register Sequences
AMBA: Enabling Reusable On-Chip Designs
IEEE Micro
Test Cost Minimization for Hybrid Bist
DFT '00 Proceedings of the 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Synthesis of Mapping Logic for Generating Transformed Pseudo-Random Patterns for BIST
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
MFBIST: A BIST Method for Random Pattern Resistant Circuits
Proceedings of the IEEE International Test Conference on Test and Design Validity
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
BETSY: synthesizing circuits for a specified BIST environment
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Testing embedded-core based system chips
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Test point insertion based on path tracing
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Application of Deterministic Logic BIST on Industrial Circuits
ITC '00 Proceedings of the 2000 IEEE International Test Conference
A Hybrid BIST Architecture and its Optimization for SoC Testing
ISQED '02 Proceedings of the 3rd International Symposium on Quality Electronic Design
Testing Reusable IP - A Case Study
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Testing of Digital Systems
Hybrid BIST Time Minimization for Core-Based Systems with STUMPS Architecture
DFT '03 Proceedings of the 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Pseudo-Random Pattern Generator Design for Column-Matching BIST
DSD '07 Proceedings of the 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools
Test time minimization for hybrid BIST of core-based systems
Journal of Computer Science and Technology
Challenges in testing core-based system ICs
IEEE Communications Magazine
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Classical built-in self-test (BIST) approaches are largely based on pseudorandom testing, and using linear feedback shift registers (LFSR) for test set generation and test response compaction. In this paper, we are concentrating on one possible extension of the classical BIST, namely hybrid BIST, where pseudorandom test patterns are complemented with pre-computed deterministic test patterns to increase the fault coverage and to reduce test time. We will propose a novel method for hybrid BIST optimization, based on reseeding and test set compaction. The objective is to minimize the test time at given test memory constraints, without losing test quality. We will compare the proposed method with hybrid BIST methods developed earlier and analyze its suitability for testing core-based systems.