Test Data Compression by Spilt-VIHC (SVIHC)

Authors:
Chandan Giri;B. Mallikarjuna Rao;Santanu Chattopadhyay
Affiliations:
IIT Kharagpur, India;Interra Systems, India;IIT Kharagpur, India
Venue:
ICCTA '07 Proceedings of the International Conference on Computing: Theory and Applications
Year:
2007

Citing 0
Cited 4

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IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Run-length-based test data compression techniques: how far from entropy and power bounds?—a survey

VLSI Design
Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead

Journal of Electronic Testing: Theory and Applications
Analysis of test data compression techniques emphasizing statistical coding schemes

Proceedings of the International Conference & Workshop on Emerging Trends in Technology

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Abstract

This paper suggests a new test data compression scheme that performs Huffman coding on different sections of test data file separately. It improves upon the single Huffman tree based approach by upto 6% in compression ratio, 29% in test application time, sacrificing only 6.1%in the decoder area. The scheme compares favourably with other works reported in the literature. While for most of the cases, it produces better compression ratios, the area requirements are much lesser than other contemporary works.