Tailoring ATPG for embedded testing
Proceedings of the IEEE International Test Conference 2001
Efficient Seed Utilization for Reseeding based Compression
VTS '03 Proceedings of the 21st IEEE VLSI Test Symposium
Reducing Test Dat Volume Using LFSR Reseeding with Seed Compression
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Reducing Test Application Time Through Test Data Mutation Encoding
Proceedings of the conference on Design, automation and test in Europe
IEEE Transactions on Computers
Adjustable Width Linear Combinational Scan Vector Decompression
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores
VLSID '05 Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
Using Statistical Transformations to Improve Compression for Linear Decompressors
DFT '05 Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Adaptive Encoding Scheme for Test Volume/Time Reduction in SoC Scan Testing
ATS '05 Proceedings of the 14th Asian Test Symposium on Asian Test Symposium
PIDISC: Pattern Independent Design Independent Seed Compression Technique
VLSID '06 Proceedings of the 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design
Combining Linear and Non-Linear Test Vector Compression Using Correlation-Based Rectangular Encoding
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Nine-coded compression technique for testing embedded cores in socs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Test set compaction algorithms for combinational circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Automated synthesis of phase shifters for built-in self-test applications
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
System-on-a-chip test-data compression and decompression architectures based on Golomb codes
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Test data compression and decompression based on internal scan chains and Golomb coding
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A unified approach to reduce SOC test data volume, scan power and testing time
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Variable-length input Huffman coding for system-on-a-chip test
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
An efficient test vector compression scheme using selective Huffman coding
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Multiphase BIST: a new reseeding technique for high test-data compression
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Multilevel Huffman Coding: An Efficient Test-Data Compression Method for IP Cores
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Scan-chain partition for high test-data compressibility and low shift power under routing constraint
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Computers and Electrical Engineering
LFSR-based test-data compression with self-stoppable seeds
Proceedings of the Conference on Design, Automation and Test in Europe
Journal of Electronic Testing: Theory and Applications
Test data compression using efficient bitmask and dictionary selection methods
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Efficient Test Compression Technique for SoC Based on Block Merging and Eight Coding
Journal of Electronic Testing: Theory and Applications
Hi-index | 0.00 |
Various compression methods have been proposed for tackling the problem of increasing test-data volume of contemporary, core-based systems. Despite their effectiveness, most of the approaches that are based on classical codes (e.g., run-lengths, Huffman) cannot exploit the test-application-time advantage of multiple-scan-chain cores, since they are not able to perform parallel decompression of the encoded data. In this paper, we take advantage of the inherent parallelism of Huffman decoding and we present a generalized multilevel Huffman-based compression approach that is suitable for cores with multiple scan chains. The size of the encoded data blocks is independent of the slice size (i.e., the number of scan chains), and thus it can be adjusted so as to maximize the compression ratio. At the same time, the parallel data-block decoding ensures the exploitation of most of the scan chains' parallelism. The proposed decompression architecture can be easily modified to suit any Huffman-based compression scheme.