PIDISC: Pattern Independent Design Independent Seed Compression Technique

Authors:
Kedarnath J. Balakrishnan;Seongmoon Wang;Srimat T. Chakradhar
Affiliations:
NEC Laboratories America;NEC Laboratories America;NEC Laboratories America
Venue:
VLSID '06 Proceedings of the 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design
Year:
2006

Citing 0
Cited 3

State skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores

Proceedings of the conference on Design, automation and test in Europe
Multilevel-Huffman test-data compression for IP cores with multiple scan chains

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - Special section on the ACM IEEE international conference on formal methods and models for codesign (MEMOCODE) 2009

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Abstract

A novel scheme for compressing the seeds of a linear feedback shifter register (LFSR) is presented. Instead of storing the seeds of the LFSR in the tester, the scheme compresses the seeds and stores them in the tester. The compression scheme can be used with any variation of static LFSR reseeding. An important feature of the proposed scheme is that the decompressor is test pattern and design independent and can be implemented with very little area overhead. Experimental results show that seed compression can improve overall compression by a factor of 7x for large industrial circuits.