On Using Exponential-Golomb Codes and Subexponential Codes for System-on-a-Chip Test Data Compression

Authors:
Lei Li;Krishnendu Chakrabarty
Affiliations:
Department of Electrical and Computer Engineering, Duke University, Durham, USA 27708;Department of Electrical and Computer Engineering, Duke University, Durham, USA 27708
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2004

Citing 13
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Abstract

We examine the use of exponential-Golomb codes and subexponential codes can be used for the compression of scan test data in core-based system-on-a-chip (SOC) designs. These codes are well-known in the data compression domain but their application to SOC testing has not been explored before. We show that these codes often provide slighly higher compression than alternative methods that have been proposed recently.