On output response compression in the presence of unknown output values
Proceedings of the 39th annual Design Automation Conference
OPMISR: the foundation for compressed ATPG vectors
Proceedings of the IEEE International Test Conference 2001
Application of Saluja-Karpovsky Compactors to Test Responses with Many Unknowns
VTS '03 Proceedings of the 21st IEEE VLSI Test Symposium
Embedded Deterministic Test for Low-Cost Manufacturing Test
ITC '02 Proceedings of the 2002 IEEE International Test Conference
On Compacting Test Response Data Containing Unknown Values
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
VLSID '05 Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
Response compaction with any number of unknowns using a new LFSR architecture
Proceedings of the 42nd annual Design Automation Conference
ITC '04 Proceedings of the International Test Conference on International Test Conference
X-Masking During Logic BIST and Its Impact on Defect Coverage
ITC '04 Proceedings of the International Test Conference on International Test Conference
Channel Masking Synthesis for Efficient On-Chip Test Compression
ITC '04 Proceedings of the International Test Conference on International Test Conference
Response shaper: a novel technique to enhance unknown tolerance for output response compaction
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Modular Compactor of Test Responses
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
X-masking during logic BIST and its impact on defect coverage
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Test response compactor with programmable selector
Proceedings of the 43rd annual Design Automation Conference
Unknown blocking scheme for low control data volume and high observability
Proceedings of the conference on Design, automation and test in Europe
X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors
IEEE Transactions on Computers
VTS '08 Proceedings of the 26th IEEE VLSI Test Symposium
Masking of X-values by Use of a Hierarchically Configurable Register
ETS '09 Proceedings of the 2009 European Test Symposium
Highly X-Tolerant Selective Compaction of Test Responses
VTS '09 Proceedings of the 2009 27th IEEE VLSI Test Symposium
X-align: improving the scan cell observability of response compactors
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
X-compact: an efficient response compaction technique
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
An Efficient Unknown Blocking Scheme for Low Control Data Volume and High Observability
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs
Journal of Electronic Testing: Theory and Applications
Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs
Proceedings of the International Conference on Computer-Aided Design
| Hi-index | 0.03 |
Unknown (X) states are increasingly often identified as having potential for rendering semiconductor tests useless. One of the key requirements for a reliable test response compactor is, therefore, to preserve observability of any scan cell for a wide range of X-profiles while maintaining very high-compaction ratios, providing ability to detect a variety of failures found in real silicon, and assuring design simplicity. We have proposed a fully X-tolerant test response compaction scheme which is based on a flexible scan chain selection mechanism. This new approach delivers extremely high compression of test results by observing that X states are typically not randomly distributed in test responses. Identical or similar patterns of correlated X states let the proposed scheme reduce the size of a scan chain selector and the amount of test data used to control it. It handles, moreover, a wide range of unknown state profiles such that all X states, including those being clustered and of high density, are suppressed in a per-cycle mode without compromising the test quality.