On Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios

Authors:
Huaxing Tang;Chen Wang;Janusz Rajski;Sudhakar M. Reddy;Jerzy Tyszer;Irith Pomeranz
Affiliations:
University of Iowa;Mentor Graphic Corporation;Mentor Graphic Corporation;University of Iowa;Poznan University of Technology;Purdue University
Venue:
VLSID '05 Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
Year:
2005

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Abstract

We propose an enhanced selective compaction scheme, which integrates three techniques, called selectively filled tests, selective chains masking and selective chains observation, to reduce the impact of unknown values on the test response compaction ratio. Experimental results on several industrial designs demonstrate the effectiveness of the proposed scheme in achieving a very high test response compaction ratio without compromising the test quality.