Analysis and Design of Optimal Combinational Compactors
VTS '03 Proceedings of the 21st IEEE VLSI Test Symposium
Application of Saluja-Karpovsky Compactors to Test Responses with Many Unknowns
VTS '03 Proceedings of the 21st IEEE VLSI Test Symposium
OPMISR: The Foundation for Compressed ATPG Vectors
ITC '01 Proceedings of the 2001 IEEE International Test Conference
X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Masking of Unknown Output Values during Output Response Compression byUsing Comparison Units
IEEE Transactions on Computers
On Compacting Test Response Data Containing Unknown Values
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
VLSID '05 Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
Response compaction with any number of unknowns using a new LFSR architecture
Proceedings of the 42nd annual Design Automation Conference
Synthesis of X-Tolerant Convolutional Compactors
VTS '05 Proceedings of the 23rd IEEE Symposium on VLSI Test
X-Masking During Logic BIST and Its Impact on Defect Coverage
ITC '04 Proceedings of the International Test Conference on International Test Conference
Channel Masking Synthesis for Efficient On-Chip Test Compression
ITC '04 Proceedings of the International Test Conference on International Test Conference
Theoretic analysis and enhanced X-tolerance of test response compact based on convolutional code
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
A hybrid scheme for compacting test responses with unknown values
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
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For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. aliasing). In this paper, we first propose a mathematical framework to estimate the percentage of observable responses under unknown-induced masking for a space compactor. We further develop a prediction scheme which can correlate the percentage of observable responses with the modeled-fault coverage and with a n-detection metric for a given test set. As a result, the quality of a space compactor can be measured directly based on its test quality, instead of based on indirect metrics such as the number of tolerated unknowns or the aliasing probability. With the prediction scheme above, we propose a construction flow for space compactors to achieve the desired level of test quality while maximizing the compaction ratio.