Response compaction with any number of unknowns using a new LFSR architecture
Proceedings of the 42nd annual Design Automation Conference
ChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
X-Tolerant Test Response Compaction
IEEE Design & Test
Response shaper: a novel technique to enhance unknown tolerance for output response compaction
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Efficient unknown blocking using LFSR reseeding
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Proceedings of the 43rd annual Design Automation Conference
Test response compactor with programmable selector
Proceedings of the 43rd annual Design Automation Conference
Fault detection and diagnosis with parity trees for space compaction of test responses
Proceedings of the 43rd annual Design Automation Conference
Unknown blocking scheme for low control data volume and high observability
Proceedings of the conference on Design, automation and test in Europe
Test generation in the presence of timing exceptions and constraints
Proceedings of the 44th annual Design Automation Conference
X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis
IEEE Design & Test
A hybrid scheme for compacting test responses with unknown values
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
GECOM: test data compression combined with all unknown response masking
Proceedings of the 2008 Asia and South Pacific Design Automation Conference
Using reiterative LFSR based X-masking to increase output compression in presence of unknowns
Proceedings of the 18th ACM Great Lakes symposium on VLSI
Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate
IEICE - Transactions on Information and Systems
X-tolerant Test Data Compaction with Accelerated Shift Registers
Journal of Electronic Testing: Theory and Applications
X-align: improving the scan cell observability of response compactors
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
On compaction utilizing inter and intra-correlation of unknown states
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Fully X-tolerant, very high scan compression
Proceedings of the 47th Design Automation Conference
Masking of X-Values by Use of a Hierarchically Configurable Register
Journal of Electronic Testing: Theory and Applications
Construction and Analysis of Augmented Time Compactors
Journal of Electronic Testing: Theory and Applications
An ATE assisted DFD technique for volume diagnosis of scan chains
Proceedings of the 50th Annual Design Automation Conference
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The effectiveness of on-product Test Compression methods is degraded by the capture of unknown logic states ("X-states") by the scan elements. This paper describes a simple but cost-effective solution called channel masking that masks the X-states and allows test compression methods to be widely deployed on a variety of designs. It also discusses various aspects of the channel masking hardware and the synthesis and validation methodology to support its use in a typical design flow. Results are presented to show its effectiveness on some large industrial designs.