On output response compression in the presence of unknown output values
Proceedings of the 39th annual Design Automation Conference
OPMISR: the foundation for compressed ATPG vectors
Proceedings of the IEEE International Test Conference 2001
Scalable selector architecture for x-tolerant deterministic BIST
Proceedings of the 41st annual Design Automation Conference
Response compaction with any number of unknowns using a new LFSR architecture
Proceedings of the 42nd annual Design Automation Conference
Channel Masking Synthesis for Efficient On-Chip Test Compression
ITC '04 Proceedings of the International Test Conference on International Test Conference
Response shaper: a novel technique to enhance unknown tolerance for output response compaction
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Survey of Test Vector Compression Techniques
IEEE Design & Test
VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
X-compact: an efficient response compaction technique
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Finite memory test response compactors for embedded test applications
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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This paper addresses the problem of increasing unknowns in the output response data by exploring reiterative LFSR reseeding based X-masking. This approach takes advantage of the data correlation in the output response data to enable LFSR encoded masks to be reused for multiple scan slices while guaranteeing that all unknowns are masked and all bits required for fault detection are allowed to propagate to the compactor. This paper also investigates a hybrid approach that combines conventional LFSR reseeding based X-masking with fixed-interval reiterative LFSR X-masking. Experimental results for applying this approach to industrial designs indicate that significant amounts of output compression can be achieved without any pattern count inflation or loss in fault coverage.