Built-in test for VLSI: pseudorandom techniques
Built-in test for VLSI: pseudorandom techniques
Effective diagnostics through interval unloads in a BIST environment
Proceedings of the 39th annual Design Automation Conference
On output response compression in the presence of unknown output values
Proceedings of the 39th annual Design Automation Conference
Structured Logic Testing
OPMISR: the foundation for compressed ATPG vectors
Proceedings of the IEEE International Test Conference 2001
Efficient compression and application of deterministic patterns in a logic BIST architecture
Proceedings of the 40th annual Design Automation Conference
X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Embedded Deterministic Test for Low-Cost Manufacturing Test
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Logic BIST for Large Industrial Designs: Real Issues and Case Studies
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Column Parity Row Selection (CPRS) BIST Diagnosis Technique: Modeling and Analysis
IEEE Transactions on Computers
Scan test planning for power reduction
Proceedings of the 44th annual Design Automation Conference
Using reiterative LFSR based X-masking to increase output compression in presence of unknowns
Proceedings of the 18th ACM Great Lakes symposium on VLSI
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
BISD: scan-based built-in self-diagnosis
Proceedings of the Conference on Design, Automation and Test in Europe
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X-tolerant deterministic BIST (XDBIST) was recently presented as a method to efficiently compress and apply scan patterns generated by automatic test pattern generation (ATPG) in a logic built-in self-test architecture. In this paper we introduce a novel selector architecture that allows arbitrary compression ratios, scales to any number of scan chains and minimizes area overhead. XDBIST test-coverage, full X-tolerance and scan-based diagnosis ability are preserved and are the same as deterministic scan-ATPG.