X-Tolerant Test Response Compaction
IEEE Design & Test
XPAND: An Efficient Test Stimulus Compression Technique
IEEE Transactions on Computers
Theoretic analysis and enhanced X-tolerance of test response compact based on convolutional code
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Test response compactor with programmable selector
Proceedings of the 43rd annual Design Automation Conference
Test generation in the presence of timing exceptions and constraints
Proceedings of the 44th annual Design Automation Conference
Scan Test Response Compaction Combined with Diagnosis Capabilities
Journal of Electronic Testing: Theory and Applications
GECOM: test data compression combined with all unknown response masking
Proceedings of the 2008 Asia and South Pacific Design Automation Conference
Using reiterative LFSR based X-masking to increase output compression in presence of unknowns
Proceedings of the 18th ACM Great Lakes symposium on VLSI
CASP: concurrent autonomous chip self-test using stored test patterns
Proceedings of the conference on Design, automation and test in Europe
DX-compactor: distributed X-compaction for SoCs
Proceedings of the 19th ACM Great Lakes symposium on VLSI
X-tolerant Test Data Compaction with Accelerated Shift Registers
Journal of Electronic Testing: Theory and Applications
Low-power scan testing for test data compression using a routing-driven scan architecture
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
On compaction utilizing inter and intra-correlation of unknown states
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Test Data Compression Using Multi-dimensional Pattern Run-length Codes
Journal of Electronic Testing: Theory and Applications
Post-silicon validation opportunities, challenges and recent advances
Proceedings of the 47th Design Automation Conference
A combinatorial approach to X-tolerant compaction circuits
IEEE Transactions on Information Theory
BISD: scan-based built-in self-diagnosis
Proceedings of the Conference on Design, Automation and Test in Europe
A diagnosis algorithm for extreme space compaction
Proceedings of the Conference on Design, Automation and Test in Europe
Fault diagnosis aware ATE assisted test response compaction
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Diagnosis of logic circuits using compressed deterministic data and on-chip response comparison
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Test data compression using selective encoding of scan slices
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Construction and Analysis of Augmented Time Compactors
Journal of Electronic Testing: Theory and Applications
Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs
Journal of Electronic Testing: Theory and Applications
Cross-layer error resilience for robust systems
Proceedings of the International Conference on Computer-Aided Design
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Compaction of test response at self-testing in the programmable logic matrices
Automation and Remote Control
Overcoming post-silicon validation challenges through quick error detection (QED)
Proceedings of the Conference on Design, Automation and Test in Europe
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X-Compact is an X-tolerant test response compaction technique. It enables up to exponential reduction in the test response data volume and the number of pins required to collect test response from a chip. The compaction hardware requires negligible area, does not add any extra delay during normal operation, guarantees detection of defective chips even in the presence of unknown logic values (often referred to as X's), and preserves diagnosis capabilities for most practical scenarios. The technique has minimum impact on current design and test flows, and can be used to reduce test time, test-data volume, test-input/output pins and tester channels, and also to improve test quality.