Design of compactors for signature-analyzers in built-in self-test
Proceedings of the IEEE International Test Conference 2001
Fault diagnosis based on effect-cause analysis: An introduction
DAC '80 Proceedings of the 17th Design Automation Conference
Compactor Independent Direct Diagnosis
ATS '04 Proceedings of the 13th Asian Test Symposium
Survey of Test Vector Compression Techniques
IEEE Design & Test
A diagnosis algorithm for extreme space compaction
Proceedings of the Conference on Design, Automation and Test in Europe
X-compact: an efficient response compaction technique
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Finite memory test response compactors for embedded test applications
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Recently a new method called ATE assisted compaction for achieving test response compaction has been proposed. The method relies on testers to achieve additional compaction, without compromising fault coverage, beyond what may already be achieved using on-chip response compactors. The method does not add additional logic or modify the circuit under test or require additional tests and thus can be used with any design including legacy designs. In this work, we enhance this method so that the level of diagnostic resolution achieved without it can be maintained. Experimental results on larger ISCAS-89 show that additional test response compaction can be achieved while diagnostic resolution for single and double stuck-at faults is not adversely impacted by the procedure.