Design of compactors for signature-analyzers in built-in self-test

Effective diagnostics through interval unloads in a BIST environment

Proceedings of the 39th annual Design Automation Conference

Efficient compression and application of deterministic patterns in a logic BIST architecture

Proceedings of the 40th annual Design Automation Conference

Compacting Test Responses for Deeply Embedded SoC Cores

IEEE Design & Test

Theoretic analysis and enhanced X-tolerance of test response compact based on convolutional code

Proceedings of the 2005 Asia and South Pacific Design Automation Conference

Test resource partitioning based on efficient response compaction for test time and tester channels reduction

Journal of Computer Science and Technology

Reconfigured Scan Forest for Test Application Cost, Test Data Volume, and Test Power Reduction

IEEE Transactions on Computers

X-align: improving the scan cell observability of response compactors

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Fully X-tolerant, very high scan compression

Proceedings of the 47th Design Automation Conference

A combinatorial approach to X-tolerant compaction circuits

IEEE Transactions on Information Theory

Fault diagnosis aware ATE assisted test response compaction

Proceedings of the 16th Asia and South Pacific Design Automation Conference

Construction and Analysis of Augmented Time Compactors

Journal of Electronic Testing: Theory and Applications