Fully X-tolerant, very high scan compression

Authors:
Peter Wohl;John A. Waicukauski;Frederic Neuveux;Emil Gizdarski
Affiliations:
Synopsys, Inc.;Synopsys, Inc.;Synopsys, Inc.;Synopsys, Inc.
Venue:
Proceedings of the 47th Design Automation Conference
Year:
2010

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Abstract

This paper presents a new X-blocking system which allows very high compression and full coverage even if the density of unknown values is very high and varies every shift. Despite the presence of Xs in scan cells, compression can be maximized by using PRPG and MISR structures. Results on industrial designs with various X densities demonstrate consistently high compression and full test coverage.