An Economic Analysis and ROI Model for Nanometer Test

Authors:
Brion Keller;Mick Tegethoff;Thomas Bartenstein;Vivek Chickermane
Affiliations:
Cadence Design Systems, Inc Endicott, NY;Cadence Design Systems, Inc Endicott, NY;Cadence Design Systems, Inc Endicott, NY;Cadence Design Systems, Inc Endicott, NY
Venue:
ITC '04 Proceedings of the International Test Conference on International Test Conference
Year:
2004

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Abstract

This paper describes an Economic and Return-on- Investment (RoI) model for a test methodology that ensures product quality for logic devices that are in the 130 nm technology node and below. We describe the key components of the nanometer test methodology (NTM) and how it drives the model. In addition to ensuring product quality we address the cost of test and time to volume and how both factors can be improved. Examples from realistic scenarios are provided to illustrate the net savings from the proposed NTM using this model.