X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis

Authors:
Jerzy Tyszer;Janusz Rajski;Grzegorz Mrugalski;Nilanjan Mukherjee;Mark Kassab;Wu-Tung Cheng;Manish Sharma;Liyang Lai
Affiliations:
Poznań University of Technology;Mentor Graphics;Mentor Graphics;Mentor Graphics;Mentor Graphics;Mentor Graphics;Mentor Graphics;Mentor Graphics
Venue:
IEEE Design & Test
Year:
2007

Citing 9
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Abstract

This article presents a two-stage test response compactor with scan selection logic and an on-chip compare-and-response collector. This compactor is capable of handling a wide range of X state profiles, offers compression far higher than the ratio of scan chains to compactor outputs, and provides excellent diagnostic resolution.