Optimized integration of test compression and sharing for SOC testing
Proceedings of the conference on Design, automation and test in Europe
X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis
IEEE Design & Test
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A diagnosis algorithm for extreme space compaction
Proceedings of the Conference on Design, Automation and Test in Europe
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Most scan based designs implement the scan enable as a slow speed global control signal, and can therefore only implement launch-on-capture (LOC) delay tests. Launch-onshift (LOS) tests are generally more effective, achieving higher fault coverage with ...