On output response compression in the presence of unknown output values
Proceedings of the 39th annual Design Automation Conference
Design of Parameterizable Error-Propagating Space Compactors for Response Observation
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
Parity-Based Output Compaction for Core-Based SOCs
ETW '03 Proceedings of the 8th IEEE European Test Workshop
X-Masking During Logic BIST and Its Impact on Defect Coverage
ITC '04 Proceedings of the International Test Conference on International Test Conference
Channel Masking Synthesis for Efficient On-Chip Test Compression
ITC '04 Proceedings of the International Test Conference on International Test Conference
Zero-aliasing space compaction using linear compactors with bounded overhead
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Scan chain organization for embedded diagnosis
Proceedings of the conference on Design, automation and test in Europe
A diagnosis algorithm for extreme space compaction
Proceedings of the Conference on Design, Automation and Test in Europe
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This paper shows that accurate fault detection and diagnosis are possible when applying a parity tree for space compaction of test responses and continuously observing the parity-tree output. We exploit that each set of faults results in a unique parity-tree output sequence that can be used as a unique fault signature for truly accurate fault detection and diagnosis. Our theoretical analysis shows that probabilities for fault cancellation and fault aliasing are extremely low and decrease with circuit size. Experimental results show that for a typical scan chain architecture in large industrial circuits, fault coverage is not affected by parity-tree space compaction for up to 256 scan chains, while diagnostic resolution is reduced by only 1% to 2%.