OPMISR: The Foundation for Compressed ATPG Vectors

Authors:
Carl Barnhart;Vanessa Brunkhorst;Frank Distler;Owen Farnsworth;Brion Keller;Bernd Koenemann
Affiliations:
-;-;-;-;-;-
Venue:
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Year:
2001

Citing 10
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Abstract

Rapid increases in the wire-able gate counts of ASICsstresses existing manufacturing test equipment in termsof test data volume and test capacity. Techniques arepresented in this paper that allow for substantialcompression of Automatic Test Pattern Generation(ATPG) produced test vectors. We show compressionefficiencies allowing a more than 10-fold reduction intester scan buffer data volume on ATPG compactedtests. In addition, we obtain almost a 2x scan test timereduction. By implementing these techniques forproduction testing of huge-gate-count ASICs, IBM willcontinue using existing automated test equipment(ATE) - avoiding costly upgrades and replacements.