X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector

Authors:
J. Rajski;J. Tyszer;G. Mrugalski;Wu-Tung Cheng;N. Mukherjee;M. Kassab
Affiliations:
Mentor Graphics Corp., Wilsonville;-;-;-;-;-
Venue:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Year:
2008

Citing 0
Cited 3

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Abstract

This paper presents X-Press - a new two-stage test-response compactor that can be easily integrated with a multiple scan-chain environment. This compactor preserves all benefits of spatial compaction and offers, due to its overdrive sequential section, compression much higher than the ratio of scan chains to compactor outputs. X-Press is also capable of handling a wide range of unknown (X) state profiles by deploying a two-level scan-chain-selection mechanism. In addition to a new compactor architecture, original contributions of this paper include a detailed analysis of two-level error masking caused by X states and a new algorithm to both rank scan chains and then to determine, in per-pattern mode, scan-chain-selection rules used to suppress X states. Experimental results obtained for a variety of designs show feasibility and efficiency of the proposed compaction scheme, altogether with actual impact of X states on a test-pattern count. Finally, diagnostic capabilities of the proposed scheme accompanied by further experimental results are also analyzed.