Changing the Scan Enable during Shift

Authors:
Nodari Sitchinava;Samitha Samaranayake;Rohit Kapur;Emil Gizdarski;Fredric Neuveux;T. W. Williams
Affiliations:
-;-;-;-;-;-
Venue:
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Year:
2004

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Abstract

This paper extends the Reconfigurable Shared Scan-inarchitecture (RSSA) to provide additional ability to changevalues on the scan configuration signals (scan enablesignals) during the scan operation on a per-shift basis. Weshow that the extra flexibility of reconfiguring the scanchains every shift cycle reduces the number of differentconfigurations required by RSSA while keeping test coveragethe same. In addition a simpler analysis can be used toconstruct the scan chains.This is the first paper of its kind that treats the ScanEnable signal as a test data signal during the scan operationof a test pattern. Results are presented on some ISCAS aswell as industrial circuits.