Using a single input to support multiple scan chains
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Test volume and application time reduction through scan chain concealment
Proceedings of the 38th annual Design Automation Conference
Reducing Test Application Time for Full Scan Embedded Cores
FTCS '99 Proceedings of the Twenty-Ninth Annual International Symposium on Fault-Tolerant Computing
A Reconfigurable Shared Scan-in Architecture
VTS '03 Proceedings of the 21st IEEE VLSI Test Symposium
VTS '03 Proceedings of the 21st IEEE VLSI Test Symposium
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Embedded Deterministic Test for Low-Cost Manufacturing
IEEE Design & Test
Changing the Scan Enable during Shift
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
XPAND: An Efficient Test Stimulus Compression Technique
IEEE Transactions on Computers
VirtualScan: A New Compressed Scan Technology for Test Cost Reduction
ITC '04 Proceedings of the International Test Conference on International Test Conference
Survey of Test Vector Compression Techniques
IEEE Design & Test
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Ensuring a high manufacturing test quality of an integrated electronic circuit mandates the application of a large volume test set. Even if the test data can be fit into the memory of an external tester, the consequent increase in test application time reflects into elevated production costs. Test data compression solutions have been proposed to address the test time and data volume problem by storing and delivering the test data in a compressed format, and subsequently by expanding the data on-chip. In this paper, we propose a scan cell positioning methodology that accompanies a compression technique in order to boost the compression ratio, and squash the test data even further. While we present the application of the proposed approach in conjunction with the fan-out based decompression architecture, this approach can be extended for application along with other compression solutions as well. The experimental results also confirm the compression enhancement of the proposed methodology.