Decompression Hardware Determination for Test Volume and Time Reduction through Unified Test Pattern Compaction and Compression

Authors:
Ismet Bayraktaroglu;Alex Orailoglu
Affiliations:
-;-
Venue:
VTS '03 Proceedings of the 21st IEEE VLSI Test Symposium
Year:
2003

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Abstract

A methodology for the determination of decompressionhardware that guarantees complete fault coverage for a unifiedcompaction/compression scheme is proposed. Test cubeinformation is utilized for the determination of a near optimaldecompression hardware. The proposed scheme attainssimultaneously high compression levels and reducedpattern counts through a linear decompression hardware.Significant test volume and test application time reductionsare delivered through the scheme we propose while a highlycost effective hardware implementation is retained.