Test volume and application time reduction through scan chain concealment
Proceedings of the 38th annual Design Automation Conference
An Experimental Chip to Evaluate Test Techniques: Experiment Results
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Analysis of pattern-dependent and timing-dependent failures in an experimental test chip
ITC '98 Proceedings of the 1998 IEEE International Test Conference
OPMISR: the foundation for compressed ATPG vectors
Proceedings of the IEEE International Test Conference 2001
On n-Detection Test Sets and Variable n-Detection Test Sets for Transition Faults
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experiment
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Scan Vector Compression/Decompression Using Statistical Coding
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Embedded Deterministic Test for Low-Cost Manufacturing Test
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression
Proceedings of the conference on Design, automation and test in Europe
Frequency-Directed Run-Length (FDR) Codes with Application to System-on-a-Chip Test Data Compression
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
On Test Data Volume Reduction for Multiple Scan Chain Designs
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Compact test sets for high defect coverage
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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We consider the relationship between test data compression and the ability to perform comprehensive testing of a circuit under an n-detection test set. The size of an n-detection test set grows approximately linearly with n. Therefore, one may expect a decompresser that can decompress a compressed n-detection test set to be larger than a decompresser required for a compact conventional test set. The results presented in this work demonstrate that it is possible to use a decompresser designed based on a compact one-detection test set in order to apply an n-detection test set. Thus, the design of the decompresser does not have to be changed as n is increased. We describe a procedure that generates an n-detection test set to achieve this result.