On-Chip Weighted Random Patterns
Journal of Electronic Testing: Theory and Applications
Distributed Generation of Weighted Random Patterns
IEEE Transactions on Computers
10.3 Distributed Generation of Weighted Random Patterns
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Test Point Insertion for Compact Test Sets
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Test Width Compression for Built-In Self Testing
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Hybrid BIST Based on Repeating Sequences and Cluster Analysis
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Scan-BIST based on cluster analysis and the encoding of repeating sequences
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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