Journal of Electronic Testing: Theory and Applications
Low-power weighted pseudo-random BIST using special scan cells
Proceedings of the 14th ACM Great Lakes symposium on VLSI
Datapath BIST Insertion Using Pre-Characterized Area and Testability Data
Journal of Electronic Testing: Theory and Applications
Test data compression technique for embedded cores using virtual scan chains
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Hybrid BIST Based on Repeating Sequences and Cluster Analysis
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
A cocktail approach on random access scan toward low power and high efficiency test
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Scan-BIST based on cluster analysis and the encoding of repeating sequences
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Column-matching based mixed-mode test pattern generator design technique for BIST
Microprocessors & Microsystems
Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate
IEICE - Transactions on Information and Systems
Weighted pseudorandom hybrid BIST
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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This paper presents a new test resource partitioning scheme that is a hybrid approach between external testing and BIST. It reduces tester storage requirements and tester bandwidth requirements by orders of magnitude compared to conventional external testing, but requires much less area overhead than a full BIST implementation providing the same fault coverage. The proposed approach is based on weighted pseudo-random testing and uses a novel approach for compressing and storing the weight sets. Three levels of compression are used to greatly reduce test costs. No test points or any modifications are made to the function logic. The proposed scheme requires adding only a small amount of additional hardware to the STUMPS architecture. Experimental results comparing the proposed approach with other approaches are presented.