Test Data Compression Using Dictionaries with Fixed-Length Indices

Authors:
Lei Li;Krishnendu Chakrabarty
Affiliations:
-;-
Venue:
VTS '03 Proceedings of the 21st IEEE VLSI Test Symposium
Year:
2003

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Abstract

Localized delay defects, like resistive shorts, resistiveopens, etc., can be effectively detected by testing the longesttestable path through each wire (or gate) in the circuit. Sucha delay test set is referred to as a longest-path-per-wire testset. ...